ZetaSphere Software
One Software. Every Parameter. Full Control.
Developed for ZetaView® Evolution, ZetaSphere brings multiparameter nanoparticle analysis into one intuitive software environment.
From particle size and concentration to zeta potential and fluorescence analysis, ZetaSphere guides you seamlessly through the entire measurement workflow, making even complex nanoparticle characterization easy and straightforward.
Switch between excitation lasers with just one click and combine multiple measurement parameters for comprehensive characterization of your sample – all within a single software.
Multiparameter Analysis Made Easy
Get more information from every sample without adding complexity.
With ZetaSphere, you can combine multiple measurement parameters in a single integrated workflow:
- Particle size and size distribution
- Particle concentration
- Zeta potential
- Scatter and fluorescence analysis
- One-click switching between excitation lasers
- Multiparameter sample characterization and reporting
Live statistics provide immediate feedback on your sample and measurement conditions, helping you optimize your measurement setup before you start.
From Start-Up to Results – Guided by ZetaSphere
ZetaSphere is designed to make everyday measurements straightforward and reproducible – for experienced users as well as new operators.
The guided start-up procedure walks users through instrument preparation and essential system checks, helping ensure that the ZetaView is ready for measurement.
Predefined methods simplify routine workflows, while flexible measurement settings give advanced users the control they need for more specialized applications.
After the measurement, results can be reviewed directly in ZetaSphere and exported in commonly used formats:
PDF – ready-to-use measurement reports
CSV – for further data processing and statistical analysis
FCS – for advanced single-particle data analysis
Designed for Regulated Environments
ZetaSphere Compliance Feature
For laboratories working in regulated environments, the ZetaSphere Compliance Feature provides additional functionality to support workflows in GxP-compliant workflows.
Controlled user access, defined user roles and comprehensive audit trails help laboratories establish traceable and controlled measurement workflows. Database-based data management further supports data integrity and traceability throughout measurement and analysis.
Key compliance features include:
- Individual user accounts and role-based access
- Configurable password and access policies
- Audit trails for system and measurement activities
- Database-based data storage
- Traceable measurement methods and workflows
Standardized Instrument Qualification with QSphere
For laboratories requiring documented instrument qualification, QSphere complements the ZetaSphere environment with dedicated qualification workflows.
The software guides through standardized Installation Qualification (IQ) and Operational Qualification (OQ) procedures, supporting consistent execution and documentation of the ZetaView® system qualification.
One Platform for Your ZetaView® Workflow
Whether you are performing a quick particle size and concentration measurement, investigating fluorescent subpopulations, working in a regulated environment or automating larger sample series, ZetaSphere brings instrument control, measurement, analysis and reporting together.
More parameters. Less complexity. One intuitive workflow.
Instrument and Software. Built to Work Together.
ZetaView® and ZetaSphere give you everything you need for reliable nanoparticle characterization – from measurement setup to analysis and reporting.
